AVT will showcase print inspection, automation and AI-driven technologies at Loupe Americas 2026, where it plans to demonstrate how its Helios platform uses data processing and AI-supported workflows to assist production monitoring, defect detection and waste reduction. The company will present the technologies at Stand 3523.
According to the company, inspection solutions may appear similar at a basic level, but differences emerge through the intelligence and data-processing capabilities behind the systems.
Guy Yogev, vice president of marketing and product at AVT, said, “AI is transforming inspection from a standalone quality control function into a data-driven decision engine that helps converters improve efficiency, consistency, uptime and overall production performance.”
The company said its 100% inspection systems are designed to move beyond defect detection by supporting process optimization throughout the production workflow. Integrated with presses, rewinders and finishing equipment, the systems provide real-time visibility into print performance, enabling operators to identify trends, reduce waste, shorten setup times and maintain production stability at higher speeds.
Yogev said, “With two AVT Helios systems at the center of our display, visitors will see how data-driven inspection empowers smarter production decisions. Not only in detecting challenging print defects, color variations and mis-registration, but also leveraging production data to continuously optimize performance.”
He added, “We’re excited to demonstrate how AI supports our data processing and waste removal workflows within the Helios platform, enabling smarter daily production decisions and helping customers truly spot the difference between inspection approaches available in the market. Loupe visitors will also be among the first to discover our new data exporting and dashboarding tools, supporting enhanced automation, machine monitoring and production control.”
In addition to its inspection systems, AVT will present workflow technologies and a live demonstration of its multi-layer varnish inspection capability.
