Eriez will highlight advanced inspection technologies at Pack Expo International 2026, 18–21 October, at McCormick Place in Chicago. Visitors to Stand S-3954 in the South Hall can see live equipment demonstrations and meet with product specialists to discuss contaminant detection, product quality, and production efficiency.
Featured technologies include the PrecisionGuard X8 Metal Detector, the new X8-SF Simultaneous Frequency Metal Detector, the SenseGuard X-ray Inspection System, and an Eriez Recirculating Inspection System.
The PrecisionGuard X8 Metal Detector combines high sensitivity with intuitive operation to detect ferrous, nonferrous, and stainless steel contaminants. Its large touchscreen interface, automated product learning, and integrated data-capture capabilities simplify operation and reporting, while its rugged design supports demanding food processing environments. The X8 is available as a standalone detector or as part of a conveyorized inspection system.
The X8-SF expands the PrecisionGuard X8 platform with simultaneous frequency technology that inspects products at multiple frequencies at once. It is designed for wet, salty, and conductive foods that can challenge conventional metal detectors. The X8-SF also features a robust construction, easy-to-use touchscreen interface, and integrated data-capture capabilities.
The SenseGuard X-ray Inspection System detects contaminants, foreign objects, and irregularities such as glass, stone, bone, or dense plastic materials in product lines. X-ray detectors can inspect incoming material feeds or already packaged items, benefiting the entire downstream process.
Attendees can also see the Eriez Recirculating Inspection System in operation. With vibratory feeders connected to metal detectors in a continuous loop, the system demonstrates how processors can use Eriez equipment to verify inspection results, manage rejected products, and maintain throughput without interrupting production.
“Food processors need inspection solutions that reflect the realities of their production environments, from challenging product characteristics to the need for consistent throughput and clear documentation,” said Emmett Keim, global product manager, inspection systems, Eriez. “At Pack Expo International, we will demonstrate how our inspection technologies can help processors strengthen contaminant control systems while supporting efficient day-to-day operations.”
