Mettler-Toledo Product Inspection has launched the X56 DXD+, a dual-energy photon-counting X-ray system with AI capabilities, expanding its X6 Series portfolio for packaged food applications. The system is designed to improve detection of low-density contaminants such as rubber and plastics in products including pet food, chips and potatoes, according to the company.
The X6 Series now covers a full range of x-ray inspection solutions for different product sizes, from individual packs to large cases or multi-packs. The X56 DXD+ builds on the X16 and X36.2 systems, offering dual energy photon-counting capabilities for medium to large-sized products on single lanes, or smaller packages running across multiple lanes, in a 500mm system width.
The system incorporates AI to assist with quality inspection tasks, with the company stating it helps reduce unnecessary product rejection and addresses challenges involving overlapping or mixed products. AI integration is also available on other x-ray systems within the Mettler-Toledo product range.
Powered by DXD+ detector technology and Advanced Material Discrimination Pro (AMD Pro) software, the X56 DXD+ is said to deliver detection performance for complex applications where conventional single-energy systems may have limitations – particularly for low-density contaminants in packaged products with variability in thickness, density or overlapping textures, such as multi-packs, bags of chips or bulkier cartons.
Within the X6 Series, the X16 is positioned for inspecting single packages at high speed, while the X36.2 is designed for high-throughput environments and is available in multi-lane configurations.
The X56 DXD+ features toolless belt removal for cleaning and a hygienic design. The company states throughput rates of up to 500 products per minute. Built-in quality tools include completeness checks, clip detection and product-trapped-in-seal inspection.
The system is compatible with a range of conveyor heights and reject options, and is available in single or multi-lane configurations. It includes a recorded image database accessible on-screen or via integration with Mettler-Toledo ProdX data management software for centralized monitoring. The company states the software automates monitoring, reporting and collation of inspection activities in real time, supporting regulatory compliance and audit readiness.
Chris Plant, head of market management at Mettler-Toledo Safeline X-ray, said, “The launch of the X56 DXD+ expands our X6 Series, offering a comprehensive suite of inspection solutions tailored to modern food manufacturing. With its dual energy photon-counting capabilities, the X56 DXD+ delivers new levels of detection performance in complex packages across single and multi-lane formats. This advanced inspection capability will further help customers inspect every product with confidence, protect productivity, brand reputations and profits, plus comply easily with industry requirements.”
